Invention Grant
- Patent Title: Image analysis useful for patterned objects
-
Application No.: US16706092Application Date: 2019-12-06
-
Publication No.: US11308640B2Publication Date: 2022-04-19
- Inventor: John S. Vieceli , Stephen Tanner , John A. Moon , M. Shane Bowen
- Applicant: ILLUMINA, INC.
- Applicant Address: US CA San Diego
- Assignee: ILLUMINA, INC.
- Current Assignee: ILLUMINA, INC.
- Current Assignee Address: US CA San Diego
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06T7/73
- IPC: G06T7/73

Abstract:
A method of registering features in a repeating pattern can include (a) providing an object having a repeating pattern of features and a fiducial; (b) obtaining a target image of the object, wherein the target image includes the repeating pattern of features and the fiducial; (c) comparing the fiducial in the target image to reference data, wherein the reference data includes xy coordinates for a virtual fiducial; and (d) determining locations for the features in the target image based on the comparison of the virtual fiducial in the reference data to the fiducial in the data from the target image. The fiducial can have at least concentric circles that produce three different signal levels. The locations of the features can be determined at a variance of less than 5 μm.
Public/Granted literature
- US20200250851A1 IMAGE ANALYSIS USEFUL FOR PATTERNED OBJECTS Public/Granted day:2020-08-06
Information query