Invention Grant
- Patent Title: Test circuit using clock signals having mutually different frequency
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Application No.: US17020529Application Date: 2020-09-14
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Publication No.: US11309047B2Publication Date: 2022-04-19
- Inventor: Yutaka Uemura
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/12 ; G11C29/14

Abstract:
Disclosed herein is an apparatus that includes first and second shift register circuits coupled in series, the first and second shift register circuits being configured to perform a shift operation of a trigger signal in synchronization with a clock signal, and a clock control circuit configured to set a frequency of the clock signal to a first frequency when the trigger signal is in the first shift register circuit and set a frequency of the clock signal to a second frequency different from the first frequency when the trigger signal is in the second shift register circuit.
Public/Granted literature
- US20220084615A1 TEST CIRCUIT USING CLOCK SIGNALS HAVING MUTUALLY DIFFERENT FREQUENCY Public/Granted day:2022-03-17
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