Invention Grant
- Patent Title: Fabricating method of semi-polar gallium nitride
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Application No.: US17233572Application Date: 2021-04-19
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Publication No.: US11313038B2Publication Date: 2022-04-26
- Inventor: Wen-Chung Li , Ping-Hai Chiao
- Applicant: Wafer Works Corporation
- Applicant Address: TW Taoyuan
- Assignee: Wafer Works Corporation
- Current Assignee: Wafer Works Corporation
- Current Assignee Address: TW Taoyuan
- Agent Winston Hsu
- Priority: TW109128093 20200818
- Main IPC: C23C16/34
- IPC: C23C16/34 ; C23C16/02

Abstract:
A method of fabricating semi-polar gallium nitride includes providing a silicon-on-insulator (SOI) substrate. The SOI substrate includes a substrate, a silicon oxide layer and a silicon substrate. The silicon substrate has (1,0,0) facets. The silicon oxide layer is disposed between the substrate and the silicon substrate. Later, a vapor etching process is performed to etch the (1,0,0) facets to form (1,1,1) facets. The vapor etching process is performed by disposing a nebulizer under the SOI substrate. The top surface of the silicon substrate faces the nebulizer. Later, the nebulizer turns etchant into mist to etch the (1,0,0) facets by the mist to form (1,1,1) facets. Finally, an epitaxial process is performed to grow a semi-polar gallium nitride layer on the (1,1,1) facets.
Public/Granted literature
- US20220056580A1 FABRICATING METHOD OF SEMI-POLAR GALLIUM NITRIDE Public/Granted day:2022-02-24
Information query
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