Invention Grant
- Patent Title: Device and method for measuring transmittance curve of Fabry-Parot using whispering gallery mode laser source
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Application No.: US17042093Application Date: 2020-01-09
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Publication No.: US11313760B2Publication Date: 2022-04-26
- Inventor: Dong Liu , Yufei Chu , Yingjian Wang , Decheng Wu , Zhenzhu Wang , Kunming Xing , Zhiqiang Kuang , Bangxin Wang , Zhiqing Zhong , Aiyuan Fan , Chenbo Xie
- Applicant: HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
- Applicant Address: CN Anhui
- Assignee: HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
- Current Assignee: HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
- Current Assignee Address: CN Anhui
- Priority: CN201910800131.0 20190828
- International Application: PCT/CN2020/071149 WO 20200109
- International Announcement: WO2021/036167 WO 20210304
- Main IPC: G01M11/02
- IPC: G01M11/02 ; G01H9/00 ; G01J3/26 ; G01N21/59
Abstract:
Disclosed is a device and a method for measuring Fabry-Parot (FP) transmittance curve by using a whispering gallery mode laser source. The device includes: a seed laser, a first polarizer, a second polarizer, a spectroscope, a beam reduction system, a lens, and Polydimethylsiloxane (PDMS) microfluidic chip arranged in sequence.
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