Invention Grant
- Patent Title: Defect inspection method and defect inspection device
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Application No.: US16634116Application Date: 2018-07-25
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Publication No.: US11313806B2Publication Date: 2022-04-26
- Inventor: Hirotaro Tada , Akihiko Sugiura
- Applicant: The Yokohama Rubber Co., LTD.
- Applicant Address: JP Tokyo
- Assignee: The Yokohama Rubber Co., LTD.
- Current Assignee: The Yokohama Rubber Co., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Thorpe North & Western
- Priority: JPJP2017-144524 20170726
- International Application: PCT/JP2018/027998 WO 20180725
- International Announcement: WO2019/022170 WO 20190131
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/952

Abstract:
A defect image including a defect and a defect-free image not including a defect for an article different from an inspection article are acquired to teach an identifier when inspecting for a defect in the inspection article. The identifier that has learned the images is made to identify whether an extracted inspection image obtained by segmenting the inspection image of the inspection article includes the defect and the identification results of the identifier are used to determine whether a defect is present in the inspection article. When teaching the identifier the defect, the identifier is provided with, as learning images, a plurality of extracted defect images generated from the defect image by changing an extracting region for extraction from the defect image such that the defect in the defect image is at a different position in each of the plurality of extracted defect images.
Public/Granted literature
- US20200173933A1 Defect Inspection Method and Defect Inspection Device Public/Granted day:2020-06-04
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