Invention Grant
- Patent Title: Sample analysis device, sample analysis system, and method of measuring luminescence of a sample
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Application No.: US16143253Application Date: 2018-09-26
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Publication No.: US11313858B2Publication Date: 2022-04-26
- Inventor: Hiroto Kawata , Kazuya Kondoh
- Applicant: PHC HOLDINGS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: PHC HOLDINGS CORPORATION
- Current Assignee: PHC HOLDINGS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Main IPC: G01N21/75
- IPC: G01N21/75 ; G01N35/00 ; B01L3/00 ; G01N33/543 ; G01N21/64 ; G01N21/76 ; G01N21/66

Abstract:
A sample analysis device includes: a motor to rotate a sample analysis substrate with a sample introduced thereon around a rotation axis of the sample analysis substrate; a drive circuit to drive the motor; a photodetector to measure a number of photons associated with a luminescence from the sample being transmitted through a window of a measurement chamber of the sample analysis substrate; and a control circuit to calculate a measurement value of the luminescence of the sample by using a number of photons measured by the photodetector while the motor rotates the sample analysis substrate.
Public/Granted literature
- US20200096504A1 SAMPLE ANALYSIS DEVICE, SAMPLE ANALYSIS SYSTEM, AND METHOD OF MEASURING LUMINESCENCE OF A SAMPLE Public/Granted day:2020-03-26
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