A system may include a trim circuit configured to provide a trim signal to a circuit under test. The trim circuit may be configured to adjust a trim value of the trim signal based on a selection signal and a value signal. The trim signal may cause a key characteristic of the circuit under test to change based on the adjusted trim value. The system may include a production tester configured to determine whether the key characteristic is within a threshold range. Responsive to the key characteristic being within the threshold range, the production tester may stop performing the trim procedure on the circuit under test. Responsive to the key characteristic not being within the threshold range, the production tester may adjust the value signal based on whether the key characteristic is greater than or less than the threshold range.