Invention Grant
- Patent Title: Failure prediction support device, failure prediction support method and failure prediction support program
-
Application No.: US16251079Application Date: 2019-01-18
-
Publication No.: US11314243B2Publication Date: 2022-04-26
- Inventor: Keizo Tanaka , Haruna Shimakawa , Katsushige Ohnuki
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-045998 20180313
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G05B17/02 ; G05B19/4065 ; G05B19/05 ; G05B19/042

Abstract:
Provided are a failure prediction support device, a failure prediction support method, and a failure prediction support program, by which a user can easily know an abnormality in time series data relating to an apparatus. The failure prediction support device includes: a difference detection part, acquiring actual machine time series data being time series data relating to control of an apparatus and simulation time series data being time series data relating to control of the simulated apparatus, and detecting a difference between the actual machine time series data and the simulation time series data; a determination part, determining whether or not the difference satisfies a condition predetermined in relation to an abnormality in the actual machine time series data; and a notification processing part, notifying that the difference has been detected when it is determined that the difference satisfies the condition.
Public/Granted literature
Information query