Invention Grant
- Patent Title: Memory device with enhanced data reliability capabilities
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Application No.: US17000015Application Date: 2020-08-21
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Publication No.: US11314427B2Publication Date: 2022-04-26
- Inventor: Deping He , David Aaron Palmer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
Methods, systems, and devices for memory device with enhanced data reliability capabilities are described. For a write operation, a memory device may receive a write command from a host device indicating a first set of data. The memory device may determine to operate in first mode of operation associated with a reliability above a threshold and generate a second set of data to store with the first set of data based on operating in the first mode of operation. For a read operation, the memory device may identify that a read command received from a host device is associated with the first mode of operation. Based on operating in the first mode of operation, the memory device may select one or more reference thresholds (e.g., a subset of reference thresholds) to retrieve the first set of data and transmit the first set of data to the host device.
Public/Granted literature
- US20220057948A1 MEMORY DEVICE WITH ENHANCED DATA RELIABILITY CAPABILITIES Public/Granted day:2022-02-24
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