Invention Grant
- Patent Title: System and method for detecting instances of lie using Machine Learning model
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Application No.: US16830311Application Date: 2020-03-26
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Publication No.: US11315040B2Publication Date: 2022-04-26
- Inventor: Vivek Kumar Varma Nadimpalli , Gopichand Agnihotram
- Applicant: Wipro Limited
- Applicant Address: IN Bangalore
- Assignee: Wipro Limited
- Current Assignee: Wipro Limited
- Current Assignee Address: IN Bangalore
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Priority: IN202041006125 20200212
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06N20/00 ; G10L15/22 ; G06K9/46 ; G06K9/00 ; G10L15/26

Abstract:
The disclosure relates to system and method for detecting an instance of lie using a Machine Learning (ML) model. In one example, the method may include extracting a set of features from an input data received from a plurality of data sources at predefined time intervals and combining the set of features from each of the plurality of data sources to obtain a multimodal data. The method may further include processing the multimodal data through an ML model to generate a label for the multimodal data. The label is generated based on a confidence score of the ML model. The label is one of a true value that corresponds to an instance of truth or a false value that corresponds to an instance of lie.
Public/Granted literature
- US20210248511A1 SYSTEM AND METHOD FOR DETECTING INSTANCES OF LIE USING MACHINE LEARNING MODEL Public/Granted day:2021-08-12
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