Invention Grant
- Patent Title: Voltage drop mitigation techniques for memory devices
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Application No.: US16950593Application Date: 2020-11-17
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Publication No.: US11315627B1Publication Date: 2022-04-26
- Inventor: Wei Lu Chu , Dong Pan
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C11/4091
- IPC: G11C11/4091 ; G11C11/4094 ; G11C11/4063 ; G11C11/22 ; G11C11/408

Abstract:
Methods, systems, and devices for voltage drop mitigation techniques for memory devices are described. A memory device may include an array of memory cells, a conductive line, a pull-up circuit, and an output circuit. The conductive line may be configured to convey a first voltage for performing an operation with the array of memory cells. The pull-up circuit may be configured to couple the conductive line with a voltage source during at least a portion of a duration in which the operation is performed based on a first signal that enables applying a current to the array of memory cells as part of the operation. The output circuit may be configured to output a second signal to deactivate the pull-up circuit before the operation is complete. Outputting the second signal may be based on the first signal and a difference between the first voltage and a reference voltage.
Public/Granted literature
- US20220157368A1 VOLTAGE DROP MITIGATION TECHNIQUES FOR MEMORY DEVICES Public/Granted day:2022-05-19
Information query
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