Invention Grant
- Patent Title: X-ray tube and X-ray analysis system
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Application No.: US16787483Application Date: 2020-02-11
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Publication No.: US11315749B2Publication Date: 2022-04-26
- Inventor: Harry Berkhoff , Petronella Emerentiana Hegeman , Gert Van Dorssen
- Applicant: Malvern Panalytical B.V.
- Applicant Address: NL Almelo
- Assignee: Malvern Panalytical B.V.
- Current Assignee: Malvern Panalytical B.V.
- Current Assignee Address: NL Almelo
- Agency: Leason Ellis LLP
- Priority: EP19156743 20190212
- Main IPC: H01J35/08
- IPC: H01J35/08 ; H01J35/14 ; H01J35/18 ; G01N23/04 ; G01N23/207 ; G01N23/223

Abstract:
An X-ray tube according to the present invention comprises an anode and a cathode comprising an emission portion for emitting an electron beam. The emission portion is configured to irradiate a target surface of the anode with electrons to cause the anode to emit X-rays. A window is arranged at an end of the X-ray tube, to allow X-rays to exit the X-ray tube. The target surface of the anode is inclined at an oblique angle with respect to a longitudinal axis, wherein the longitudinal axis passes through the end of the X-ray tube.
Public/Granted literature
- US20200258711A1 X-ray Tube and X-Ray Analysis System Public/Granted day:2020-08-13
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