Invention Grant
- Patent Title: Skin spot evaluation apparatus, skin spot evaluation method and program
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Application No.: US15522880Application Date: 2015-11-11
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Publication No.: US11317851B2Publication Date: 2022-05-03
- Inventor: Kumiko Kikuchi , Yuji Masuda , Tetsuji Hirao
- Applicant: SHISEIDO COMPANY, LTD.
- Applicant Address: JP Tokyo
- Assignee: SHISEIDO COMPANY, LTD.
- Current Assignee: SHISEIDO COMPANY, LTD.
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JPJP2014-234938 20141119
- International Application: PCT/JP2015/081769 WO 20151111
- International Announcement: WO2016/080266 WO 20160526
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B5/107

Abstract:
To appropriately evaluate skin spots by grasping a quality (characteristic) of the skin spots. A skin spot evaluation apparatus includes an area extracting unit that extracts skin spot areas corresponding to skin spots from a skin image obtained by photographing a skin of a subject; and an evaluation unit that analyzes, based on the skin spot areas extracted by the area extracting unit, at least one of the number of the skin spots, dimension of each of the skin spots and density of each of the skin spots, and generates data obtained by quantifying characteristic of the skin spots of the skin image using the analyzed result.
Public/Granted literature
- US20170311871A1 SKIN SPOT EVALUATION APPARATUS, SKIN SPOT EVALUATION METHOD AND PROGRAM Public/Granted day:2017-11-02
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