Invention Grant
- Patent Title: Automatic analysis device
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Application No.: US16477221Application Date: 2018-02-15
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Publication No.: US11320443B2Publication Date: 2022-05-03
- Inventor: Hiroya Umeki , Kenta Imai , Yoshihiro Yamashita , Shunsuke Sasaki , Akihiro Endou
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2017-045602 20170310
- International Application: PCT/JP2018/005241 WO 20180215
- International Announcement: WO2018/163744 WO 20180913
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/10

Abstract:
An automatic analysis device includes a probe that performs a dispensing operation including a suction process and a discharge process with respect to liquid; a syringe that generates a pressure change for dispensing liquid at the probe; a flow path that connects the probe and the syringe with each other; a pressure sensor that measures the pressure change in the flow path at the time of liquid dispensing; a storage portion that stores a pressure change of time-series when reference fluid is discharged as a reference discharge pressure waveform; and a determination portion that determines whether or not there is an abnormality in the suction process of the sample from a relationship between a value of difference or a ratio between the reference discharge pressure waveform and the pressure waveform of a determination target at the time of discharge of liquid and normal range.
Public/Granted literature
- US20200249249A1 AUTOMATIC ANALYSIS DEVICE Public/Granted day:2020-08-06
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