• Patent Title: Method and device for electrical testing of an electrical assembly for defects
  • Application No.: US17253677
    Application Date: 2019-06-14
  • Publication No.: US11320477B2
    Publication Date: 2022-05-03
  • Inventor: Ulrich Pohl
  • Applicant: ATEIP GMBH
  • Applicant Address: DE Dresden
  • Assignee: ATEIP GMBH
  • Current Assignee: ATEIP GMBH
  • Current Assignee Address: DE Dresden
  • Agency: Jacobson Holman PLLC
  • Priority: DE102018209738.0 20180618,DE102018217406.7 20181011
  • International Application: PCT/EP2019/065682 WO 20190614
  • International Announcement: WO2019/243188 WO 20191226
  • Main IPC: G01R31/28
  • IPC: G01R31/28
Method and device for electrical testing of an electrical assembly for defects
Abstract:
A method for electrical testing of an electrical circuit for defects, all electrical or electronic parts are measured simultaneously, so an electrical image of the electrical circuit is received by a control/evaluation unit, in which an electrical excitation signal of an electrical current or an electrical voltage is applied simultaneously by the control/evaluation unit and a plurality of driver circuits at a plurality of test points of the electrical circuit, which test points may be arranged in any way. The electrical excitation signals applied via the driver circuits differ with regard to their spectral characteristic. The electrical current flowing in the particular test point and the resultant electrical voltage are recorded synchronously with regard to a waveform in relation to an electrical ground potential, and subsequently parameters of the parts and their electrical connections are calculated by the control/evaluation unit.
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