Invention Grant
- Patent Title: Multi-spectral X-ray detector
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Application No.: US16965942Application Date: 2019-01-28
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Publication No.: US11320544B2Publication Date: 2022-05-03
- Inventor: Matthias Simon , Hanns-Ingo Maack
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- Priority: EP18154833 20180202
- International Application: PCT/EP2019/052011 WO 20190128
- International Announcement: WO2019/149663 WO 20190808
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/24

Abstract:
Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.
Public/Granted literature
- US20210041582A1 MULTI-SPECTRAL X-RAY DETECTOR Public/Granted day:2021-02-11
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