The memory error determination device includes a processor configured to: detect a memory element in which an error has occurred in each of a plurality of layers included in a memory being three-dimensionally stacked, specify a position of each memory element in which the error has occurred in each of the plurality of layers, and determine that, when the position of each memory element in which the error has occurred is linearly aligned across a predetermined number of layers among the plurality of layers, the predetermined number being two or more, an error that has occurred in the memory is a soft error due to radiation incident on the memory.