- Patent Title: Dynamic metadata extraction workflow for measurement data storage
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Application No.: US16875669Application Date: 2020-05-15
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Publication No.: US11321341B2Publication Date: 2022-05-03
- Inventor: Sundeep Chandhoke , Michael S. Watson , Alejandro del Castillo , Daren K. Wilson
- Applicant: NATIONAL INSTRUMENTS CORPORATION
- Applicant Address: US TX Austin
- Assignee: NATIONAL INSTRUMENTS CORPORATION
- Current Assignee: NATIONAL INSTRUMENTS CORPORATION
- Current Assignee Address: US TX Austin
- Agency: Kowert, Hood, Munyon, Rankin & Goetzel P.C.
- Agent Jeffrey C. Hood; Luke Langsjoen
- Main IPC: G06F16/25
- IPC: G06F16/25 ; G06F16/16 ; G06F16/22 ; G06F16/28

Abstract:
A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.
Public/Granted literature
- US20210357421A1 DYNAMIC METADATA EXTRACTION WORKFLOW FOR MEASUREMENT DATA STORAGE Public/Granted day:2021-11-18
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