Invention Grant
- Patent Title: Three-dimensional measurement apparatus, three-dimensional measurement method and non-transitory computer readable medium
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Application No.: US16963245Application Date: 2019-02-06
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Publication No.: US11321860B2Publication Date: 2022-05-03
- Inventor: Shinya Matsumoto , Yasuhiro Ohnishi
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-023606 20180214
- International Application: PCT/JP2019/004146 WO 20190206
- International Announcement: WO2019/159769 WO 20190822
- Main IPC: G06K9/46
- IPC: G06K9/46 ; G06T7/521 ; G06T7/62 ; G06T7/73 ; G01B11/25 ; G06V10/40 ; G06V10/145

Abstract:
The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.
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