Invention Grant
- Patent Title: Multi word line assertion
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Application No.: US17120640Application Date: 2020-12-14
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Publication No.: US11322198B2Publication Date: 2022-05-03
- Inventor: Hidehiro Fujiwara , Hsien-Yu Pan , Chih-Yu Lin , Yen-Huei Chen , Wei-Chang Zhao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Merchant & Gould P.C.
- Main IPC: G11C11/418
- IPC: G11C11/418

Abstract:
A memory macro system may be provided. The memory macro system may comprise a first segment, a second segment, a first WL, and a second WL. The first segment may comprise a first plurality of memory cells. The second segment may comprise a second plurality of memory cells. The first segment may be positioned over the second segment. The first WL may correspond to the first segment and the second WL may correspond to the second segment. The first WL and the second WL may be configured to be activated in one cycle.
Public/Granted literature
- US20210098054A1 MULTI WORD LINE ASSERTION Public/Granted day:2021-04-01
Information query
IPC分类: