A semiconductor memory device includes first and second memory cells, adjacent first and second word line connected to gates of the first and second memory cells, respectively, a word line driver for the first and second word lines, a bit line connected to the first and second memory cells, a sense amplifier circuit configured to detect data stored in the memory cells via the bit line and apply a voltage to the bit line, and a control circuit configured to control the word line driver and the sense amplifier circuit to execute a write operation. During a write operation performed on the first memory cell to increase a threshold voltage of the first memory cell to a target state, the control circuit changes the bit line voltage of the bit line according to a difference between the target state and a threshold voltage state of the second memory cell.