Invention Grant
- Patent Title: Error control for memory device
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Application No.: US16895960Application Date: 2020-06-08
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Publication No.: US11322218B2Publication Date: 2022-05-03
- Inventor: Nobuo Yamamoto , Donald Martin Morgan , Victor Wong , Jongtae Kwak
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/42 ; G11C29/44 ; G11C16/10 ; G11C16/26 ; G11C29/20

Abstract:
Methods, systems, and devices for error control for memory device are described. A memory device may be configured to perform memory management operations including error control operations. For example, a memory device may be configured to perform an error control operation on data stored in a first memory cell coupled with a source row of a memory array. The memory device may be configured to write the data to a second memory cell coupled with the target row of the memory array based on performing the error control operation on the data and determine whether the management operation is complete based at least in part on the first column address of the first memory cell. The memory device may also generate an output signal to perform the error control operation on a third memory cell coupled with the source row based on determining whether the management operation is complete.
Public/Granted literature
- US20210383888A1 ERROR CONTROL FOR MEMORY DEVICE Public/Granted day:2021-12-09
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