Invention Grant
- Patent Title: Substrate processing method and substrate processing apparatus
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Application No.: US17029300Application Date: 2020-09-23
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Publication No.: US11322365B2Publication Date: 2022-05-03
- Inventor: Hiroki Murakami
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JPJP2019-180826 20190930
- Main IPC: H01L21/321
- IPC: H01L21/321 ; H01L21/3213 ; H01L21/67

Abstract:
There is provided a substrate processing method including: reducing an oxide of a ruthenium film by supplying a hydrogen-containing gas to a substrate including the ruthenium film; etching the ruthenium film by supplying an oxygen-containing gas to the substrate so as to oxidize the ruthenium film; and repeating, multiple times, a cycle including reducing the oxide of the ruthenium film and etching the ruthenium film.
Public/Granted literature
- US20210098267A1 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2021-04-01
Information query
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