Invention Grant
- Patent Title: Stacked capacitor with horizontal and vertical fin structures and method for making the same
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Application No.: US16941490Application Date: 2020-07-28
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Publication No.: US11322500B2Publication Date: 2022-05-03
- Inventor: Geeng-Chuan Chern , Liang-Choo Hsia
- Applicant: HeFeChip Corporation Limited
- Applicant Address: HK Sai Ying Pun
- Assignee: HeFeChip Corporation Limited
- Current Assignee: HeFeChip Corporation Limited
- Current Assignee Address: HK Sai Ying Pun
- Agent Winston Hsu
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L21/311

Abstract:
A stacked capacitor includes a substrate having a first ILD layer thereon and a source conductive plate in the first ILD layer; a second ILD layer disposed on the first ILD layer; and a stacked capacitor area in the second ILD layer. The stacked capacitor area partially exposes the source conductive plate. A fin-shaped structure is disposed on the source conductive plate within the stacked capacitor area. The fin-shaped structure includes horizontal fins and vertical fins. A widened central hole penetrates through the fin-shaped structure and partially exposes the source conductive plate. A first conductive layer is disposed on the fin-shaped structure and the source conductive plate in the widened central hole. A capacitor dielectric layer is disposed on the first conductive layer. A second conductive layer is disposed on the capacitor dielectric layer.
Public/Granted literature
- US20220037332A1 STACKED CAPACITOR WITH HORIZONTAL AND VERTICAL FIN STRUCTURES AND METHOD FOR MAKING THE SAME Public/Granted day:2022-02-03
Information query
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