Invention Grant
- Patent Title: Method of making radiation detector
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Application No.: US16742803Application Date: 2020-01-14
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Publication No.: US11322642B2Publication Date: 2022-05-03
- Inventor: Peiyan Cao , Yurun Liu
- Applicant: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: IPro, PLLC
- Agent Qian Gu
- Main IPC: H01L31/18
- IPC: H01L31/18 ; G01T1/24 ; H01L27/146 ; H01L21/02

Abstract:
Disclosed herein are a radiation detector and a method of making it. The radiation detector is configured to absorb radiation particles incident on a semiconductor single crystal of the radiation detector and to generate charge carriers. The semiconductor single crystal may be a CdZnTe single crystal or a CdTe single crystal. The method may comprise forming a recess into a substrate of semiconductor; forming a semiconductor single crystal in the recess; and forming a heavily doped semiconductor region in the substrate. The semiconductor single crystal has a different composition from the substrate. The heavily doped region is in electrical contact with the semiconductor single crystal and embedded in a portion of intrinsic semiconductor of the substrate.
Public/Granted literature
- US20200152820A1 RADIATION DETECTOR AND A METHOD OF MAKING IT Public/Granted day:2020-05-14
Information query
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