Invention Grant
- Patent Title: Semiconductor device including differential input circuit and calibration method thereof
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Application No.: US17189654Application Date: 2021-03-02
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Publication No.: US11323100B1Publication Date: 2022-05-03
- Inventor: Yeonsu Jang
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2020-0142115 20201029
- Main IPC: H03K5/00
- IPC: H03K5/00 ; H03K3/013 ; H03K3/0233 ; H03K5/08 ; H03K5/007 ; H03K5/24

Abstract:
According to an embodiment, a semiconductor device includes a differential input circuit suitable for receiving first and second input signals respectively inputted to first and second input transistors, and outputting an output signal; a comparison circuit suitable for generating a first judge signal by comparing the output signal with a first comparison voltage, and generating a second judge signal by comparing the output signal with a second comparison voltage, in a calibration mode; an offset control circuit suitable for adjusting coarse codes and fine codes, according to the first and second judge signals; and an offset adjusting circuit suitable for adjusting a drivability of each of the first and second input transistors by a first strength, according to the coarse codes, and adjusting the drivability of each of the first and second input transistors by a second strength smaller than the first strength, according to the fine codes.
Public/Granted literature
- US20220140818A1 SEMICONDUCTOR DEVICE INCLUDING DIFFERENTIAL INPUT CIRCUIT AND CALIBRATION METHOD THEREOF Public/Granted day:2022-05-05
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