Invention Grant
- Patent Title: Exposure detection in millimeter wave systems
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Application No.: US15852743Application Date: 2017-12-22
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Publication No.: US11324014B2Publication Date: 2022-05-03
- Inventor: Ashwin Sampath , Joseph Burke , Raghu Challa , Udara Fernando , Andrzej Partyka , Muhammad Nazmul Islam
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Arent Fox, LLP
- Main IPC: H04W72/08
- IPC: H04W72/08 ; H04B1/3827 ; H04W52/24 ; H04W72/04 ; H04W52/36 ; H04W52/14 ; H04W52/22 ; H04B17/318 ; H04W24/10 ; H04W24/02

Abstract:
In order to maintain conformance with exposure limits, in band measurements may be performed. A method, a computer-readable medium, and an apparatus may be provided for wireless communication at a user equipment. The apparatus receives an indication of a cell specific resource, e.g., a cell specific resource available for MPE measurement. The apparatus then performs a measurement based on the cell specific resource and determines whether to adjust a transmission characteristic of the user equipment based on whether the measurement meets a threshold. In another aspect a base station apparatus may configure a cell specific resource in which a user equipment may perform an MPE measurement and control use of the cell specific resource for the MPE measurement.
Public/Granted literature
- US20190200365A1 EXPOSURE DETECTION IN MILLIMETER WAVE SYSTEMS Public/Granted day:2019-06-27
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