Invention Grant
- Patent Title: Magnetic probe device
-
Application No.: US16516484Application Date: 2019-07-19
-
Publication No.: US11324104B2Publication Date: 2022-05-03
- Inventor: Kai Zhao , Yongxin Liu , Younian Wang
- Applicant: Dalian University of Technology
- Applicant Address: CN Dalian
- Assignee: Dalian University of Technology
- Current Assignee: Dalian University of Technology
- Current Assignee Address: CN Dalian
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: CN201810901359.4 20180809
- Main IPC: H05H1/00
- IPC: H05H1/00 ; H01F27/29 ; H01B11/18 ; H01F27/36 ; G01R33/02 ; G01R13/00

Abstract:
The present invention discloses a magnetic probe device. The magnetic probe device includes a magnetic probe body and a signal processing circuit, and an output end of the magnetic probe body is connected with an input end of the signal processing circuit; the signal processing circuit includes a first capacitor, a second capacitor, a Faraday shield and a step-up transformer, and the Faraday shield is fixedly arranged between a primary winding and a secondary winding of the step-up transformer; a center tap is arranged at the primary winding of the step-up transformer, and the center tap is grounded; and a first end of the primary winding is in series connection with the first capacitor, and a second end of the primary winding is in series connection with the second capacitor. The magnetic probe device provided by the present invention can improve the signal-to-noise ratio of a magnetic probe and the measurement accuracy of the magnetic field in plasma.
Public/Granted literature
- US20200053861A1 Magnetic Probe Device Public/Granted day:2020-02-13
Information query