Invention Grant
- Patent Title: Measurement position determination device
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Application No.: US16614636Application Date: 2017-05-24
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Publication No.: US11324151B2Publication Date: 2022-05-03
- Inventor: Hiroyoshi Sugita , Jun Iisaka , Hidetoshi Kawai , Yusuke Yamakage
- Applicant: FUJI CORPORATION
- Applicant Address: JP Chiryu
- Assignee: FUJI CORPORATION
- Current Assignee: FUJI CORPORATION
- Current Assignee Address: JP Chiryu
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2017/019348 WO 20170524
- International Announcement: WO2018/216132 WO 20181129
- Main IPC: H05K13/08
- IPC: H05K13/08 ; H05K13/04 ; H05K13/00

Abstract:
The measurement position determination device of the present disclosure is a measurement position determination device for determining a measurement position on a board, the measurement position being for measuring height of the board on which on which a component is mounted, and includes a measurement position determination section for acquiring one or more scheduled mounting positions of the component on the board at the time of measuring the board height and determining at least one of the acquired scheduled mounting positions as the measurement position of the board height.
Public/Granted literature
- US20200154620A1 MEASUREMENT POSITION DETERMINATION DEVICE Public/Granted day:2020-05-14
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