Invention Grant
- Patent Title: Method and system for vision-based defect detection
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Application No.: US17088591Application Date: 2020-11-04
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Publication No.: US11326935B2Publication Date: 2022-05-10
- Inventor: Jie-Ci Yang , Meng-Chao Kao , Wen-Kuong Liu
- Applicant: Wistron Corporation
- Applicant Address: TW New Taipei
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW New Taipei
- Agency: McClure, Qualey & Rodack, LLP
- Priority: TW108137945 20191021
- Main IPC: G01H9/00
- IPC: G01H9/00 ; G06K9/62 ; G06N20/10

Abstract:
A method and a system for vision-based defect detection are proposed. The method includes the following steps. A test audio signal is outputted to a device-under-test (DUT), and a response signal of the DUT with respect to the test audio signal is received to generate a received audio signal. Signal processing is performed on the received audio signal to generate a spectrogram, and whether the DUT has an unacceptable defect with respect to the predefined auditory standard is determined through computer vision according to the spectrogram.
Public/Granted literature
- US20210116293A1 METHOD AND SYSTEM FOR VISION-BASED DEFECT DETECTION Public/Granted day:2021-04-22
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