Invention Grant
- Patent Title: Strain gauge with improved temperature effect detection
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Application No.: US16965118Application Date: 2019-01-30
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Publication No.: US11326967B2Publication Date: 2022-05-10
- Inventor: Shinya Toda , Atsushi Kitamura , Akiyo Yuguchi
- Applicant: MINEBEA MITSUMI Inc.
- Applicant Address: JP Nagano
- Assignee: MINEBEA MITSUMI Inc.
- Current Assignee: MINEBEA MITSUMI Inc.
- Current Assignee Address: JP Nagano
- Agency: IPUSA, PLLC
- Priority: JPJP2018-017051 20180202
- International Application: PCT/JP2019/003228 WO 20190130
- International Announcement: WO2019/151345 WO 20190808
- Main IPC: G01L1/22
- IPC: G01L1/22 ; G01B7/16 ; G01D21/02 ; G01K7/22

Abstract:
A strain gauge includes a strain detecting unit and a temperature detecting unit that are formed on or above a flexible substrate. The strain detecting unit includes a resistor formed as a film containing Cr, CrN, and Cr2N, on one surface of a functional layer. A first metallic layer formed of a material of which a gauge factor is less than that of the resistor is laminated on a folded portion, and a resistance value of the first metallic layer on the folded portion is less than a resistance value of the folded portion. The temperature detecting unit is a thermocouple including a second metallic layer formed of a same material as the resistor, on or above the substrate; and a third metallic layer formed of a same material as the first metallic layer, on the second metallic layer.
Public/Granted literature
- US20210033476A1 STRAIN GAUGE Public/Granted day:2021-02-04
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