Invention Grant
- Patent Title: Sample measuring method and sample measurement device
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Application No.: US16205371Application Date: 2018-11-30
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Publication No.: US11327086B2Publication Date: 2022-05-10
- Inventor: Tomoyuki Nose , Sayuri Tomoda , Yusuke Miida , Kazuyoshi Horii , Kenichiro Suzuki
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Metrolex IP Law Group, PLLC
- Priority: JPJP2017-231146 20171130
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/10

Abstract:
A sample measuring method of optically measuring a sample housed in a container in a sample measurement device, the method including: loading the container such that the container is shielded from light; starting to read information regarding a measurement to be performed on the sample in response to the loading the container; and measuring the sample based on the read information.
Public/Granted literature
- US20190162740A1 SAMPLE MEASURING METHOD AND SAMPLE MEASUREMENT DEVICE Public/Granted day:2019-05-30
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