Invention Grant
- Patent Title: Automatic analysis device
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Application No.: US16483458Application Date: 2018-01-16
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Publication No.: US11327089B2Publication Date: 2022-05-10
- Inventor: Masafumi Shimada , Isao Yamazaki , Masaharu Nishida , Yoko Inoue
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2017-020340 20170207
- International Application: PCT/JP2018/000907 WO 20180116
- International Announcement: WO2018/147003 WO 20180816
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/10

Abstract:
The purpose of the present invention is to provide an automatic analysis device capable of determining, through a simple processing, whether or not idle aspirate has occurred. The automatic analysis device according to the present invention determines whether or not idle aspirate has occurred, by calculating a parameter which specifies whether or not the length of a portion of a path through which the sample passes inside a dispensing probe is shorter than that during normal aspirate, the portion being actually filled with a sample (see FIG. 4).
Public/Granted literature
- US20200041530A1 AUTOMATIC ANALYSIS DEVICE Public/Granted day:2020-02-06
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