Invention Grant
- Patent Title: Subsurface atomic force microscopy with guided ultrasound waves
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Application No.: US16604000Application Date: 2018-04-23
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Publication No.: US11327092B2Publication Date: 2022-05-10
- Inventor: Daniele Piras , Paul Louis Maria Joseph van Neer , Hamed Sadeghian Marnani
- Applicant: NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Applicant Address: NL 's-Gravenhage
- Assignee: NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Current Assignee: NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Current Assignee Address: NL 's-Gravenhage
- Agency: Lucas & Mercanti, LLP
- Priority: EP17167754 20170424
- International Application: PCT/NL2018/050256 WO 20180423
- International Announcement: WO2018/199746 WO 20181101
- Main IPC: G01Q60/42
- IPC: G01Q60/42 ; G01N29/06 ; G01N29/26 ; G01N29/265 ; B82Y15/00 ; B82Y30/00 ; B82Y35/00

Abstract:
Methods and systems for subsurface imaging of nanostructures buried inside a plate shaped substrate are provided. An ultrasonic generator at a side face of the substrate is used to couple ultrasound waves (W) into an interior of the substrate. The interior has or forms a waveguide for propagating the ultrasound waves (W) in a direction (X) along a length of the substrate transverse to the side face. The nanostructures are imaged using an AFM tip to measure an effect (E) at the top surface caused by direct or indirect interaction of the ultrasound waves (W) with the buried nanostructures.
Public/Granted literature
- US20210109128A1 SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES Public/Granted day:2021-04-15
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