Invention Grant
- Patent Title: Environment control apparatus and chip testing system
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Application No.: US17106186Application Date: 2020-11-30
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Publication No.: US11327111B2Publication Date: 2022-05-10
- Inventor: Chen-Lung Tsai , Gene Rosenthal
- Applicant: ONE TEST SYSTEMS
- Applicant Address: US CA Santa Clara
- Assignee: ONE TEST SYSTEMS
- Current Assignee: ONE TEST SYSTEMS
- Current Assignee Address: US CA Santa Clara
- Agency: Li & Cai Intellectual Property Office
- Priority: TW109117014 20200522
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A chip testing system and an environment control apparatus are provided. The chip testing system includes the environment control apparatus, a central control device, and a chip testing device. The environment control apparatus includes an apparatus body and a pressing device. When the chip testing device is disposed in an accommodating chamber of the apparatus body, and the central control device controls the pressing device to press a plurality of side surfaces of a plurality of chips carried by the chip testing device, the central control device controls the chip testing device to perform a testing operation to the chips. After the chip testing device performs the testing operation to the chips, a plurality of movable members of the pressing device protrude from a contacting surface of the pressing device and push the chips to separate the chips and the contacting surface.
Public/Granted literature
- US20210364568A1 ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM Public/Granted day:2021-11-25
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