Invention Grant
- Patent Title: Inspecting device of display panel and inspecting method of display panel using the same
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Application No.: US16593402Application Date: 2019-10-04
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Publication No.: US11328637B2Publication Date: 2022-05-10
- Inventor: Dae Hong Kim , Hyungjin Lee , Sung Hoon Yang , Se Yoon Oh
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2018-0128641 20181026
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G09G3/00 ; G06T7/00 ; G01R31/28 ; G01R19/00 ; G06T7/70

Abstract:
An inspecting device of a display panel includes a contact including first probe pins that contact to data pads of a display panel and second probe pins that contact to common voltage pads of the display panel, a signal generator coupled to the first probe pins, the signal generator configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level, a power generator coupled to the second probe pins, the power generator configured to generate a first common voltage and a second common voltage of which a voltage level is different from a voltage level of the second common voltage, and a defect detector configured to detect a defect of the display panel by removing a contact noise generated due to contact failure of the first probe pins and the second probe pins.
Information query