Invention Grant
- Patent Title: Method and system for interferometry
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Application No.: US17046781Application Date: 2019-04-18
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Publication No.: US11333484B2Publication Date: 2022-05-17
- Inventor: Shmuel Sternklar , Moshe Ben-Ayun , Egor Liokumovitch
- Applicant: Ariel Scientific Innovations Ltd.
- Applicant Address: IL Ariel
- Assignee: Ariel Scientific Innovations Ltd.
- Current Assignee: Ariel Scientific Innovations Ltd.
- Current Assignee Address: IL Ariel
- International Application: PCT/IL2019/050450 WO 20190418
- International Announcement: WO2019/202602 WO 20191024
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01B9/02003 ; G01B9/02015 ; G01B9/02001

Abstract:
An interferometer system comprises a sample interferometer arm for guiding a first wave to a sample, and receiving a reflected wave from the sample and a phase amplifier for amplifying a phase shift of the reflected wave, to provide phase-shift-amplified intermediate wave. The interferometer system can also comprise an additional interferometer arm for guiding an additional wave to combine with the intermediate wave, to provide an output wave, and a detector for detecting the output wave.
Public/Granted literature
- US20210033380A1 METHOD AND SYSTEM FOR INTERFEROMETRY Public/Granted day:2021-02-04
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