Invention Grant
- Patent Title: Method for correcting values detected by linear scales
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Application No.: US17297613Application Date: 2019-12-13
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Publication No.: US11333535B2Publication Date: 2022-05-17
- Inventor: Keita Ebisawa , Shingo Hayashi
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JPJP2018-240358 20181221
- International Application: PCT/JP2019/048984 WO 20191213
- International Announcement: WO2020/129850 WO 20200625
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01B11/00 ; G01D5/04

Abstract:
Provided is a method for more accurately correcting position coordinates of a point on an object to be imaged, the coordinates being identified based on values detected by linear scales. A visual field is moved to a measurement point defined on a recessed portion formed on a calibration plate, and an image is captured (step S13-1), edges are detected from an image of sides of the recessed portion (step 313-2), an intersection of the edges is calculated (step S13-3), values of the intersection as actually measured by the linear scales are saved (step S13-4), and position coordinates of the point on the object to be imaged as detected by the linear scales are corrected by using a true value and a difference.
Public/Granted literature
- US20220003580A1 METHOD FOR CORRECTING VALUES DETECTED BY LINEAR SCALES Public/Granted day:2022-01-06
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