Invention Grant
- Patent Title: Sample measurement device and sample measurement method
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Application No.: US16786200Application Date: 2020-02-10
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Publication No.: US11333605B2Publication Date: 2022-05-17
- Inventor: Kazuhiro Sasaki , Takeshi Yamamoto
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Crowell & Moring LLP
- Priority: JPJP2019-031055 20190222
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N15/14

Abstract:
Disclosed is a sample measurement device including a light applicator configured to apply a light to a sample so as to generate light from a particle in the sample; an optical block in which a plurality of prisms are fixed, each of the plurality of prisms including a light entry surface which allows entry thereinto of the light generated from the particle in the sample, a reflection surface configured to selectively reflect a part of the light having entered the light entry surface, and a light outputting surface configured to output the light reflected by the reflection surface; and a light receiver configured to receive the light outputted from the light outputting surface of each of the plurality of prisms.
Public/Granted literature
- US20200271585A1 SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD Public/Granted day:2020-08-27
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