Invention Grant
- Patent Title: Machine control device
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Application No.: US16742301Application Date: 2020-01-14
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Publication No.: US11334049B2Publication Date: 2022-05-17
- Inventor: Yasushi Hayashi
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2019-015203 20190131
- Main IPC: G05B19/4063
- IPC: G05B19/4063

Abstract:
A machine control device includes: a diagnostic test time calculation unit that calculates a scheduled execution time of a diagnostic test; a program execution time prediction unit that predicts a predicted ending time of a program before executing the program; a diagnostic test execution determination unit that determines whether to execute the diagnostic test at a predetermined time, by determining whether the predicted ending time of the program exceeds the scheduled execution time of the diagnostic test, and a diagnostic test execution unit that executes the diagnostic test, in which, in a case in which the predicted ending time of the program exceeds the scheduled execution time of the diagnostic test, the diagnostic test execution determination unit instructs the diagnostic test execution unit to execute the diagnostic test prior to the scheduled execution time of the diagnostic test before executing the program.
Public/Granted literature
- US20200249653A1 MACHINE CONTROL DEVICE Public/Granted day:2020-08-06
Information query
IPC分类: