Invention Grant
- Patent Title: Method for manufacturing semiconductor device and semiconductor device
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Application No.: US17294299Application Date: 2019-03-25
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Publication No.: US11335594B2Publication Date: 2022-05-17
- Inventor: Kohei Nishiguchi
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- International Application: PCT/JP2019/012435 WO 20190325
- International Announcement: WO2020/194432 WO 20201001
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/768 ; H01L23/498 ; H01L21/28 ; H01L23/532

Abstract:
A method for manufacturing a semiconductor device (10) includes, in the following order: forming a first insulating film (14) on a semiconductor substrate (12); forming, on the first insulating film (14), wiring in which at least the uppermost layer is made of Au (16); implanting ions, which do not impair insulating properties even when implanted into the insulating film (14), into the upper surface of the wiring (16) and a region not covered with the wiring (16) on the upper surface of the first insulating film (14); and forming a second insulating film (18) that covers the wiring (16).
Public/Granted literature
- US20220013408A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2022-01-13
Information query
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