Invention Grant
- Patent Title: Mobile terminal test device and mobile terminal test method
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Application No.: US17145551Application Date: 2021-01-11
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Publication No.: US11336379B2Publication Date: 2022-05-17
- Inventor: Kengo Kikuchi , Koji Fukazawa , Yuichi Tsuiki , Tsubasa Takahashi , Takato Tokuyama
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Atsugi
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Atsugi
- Agency: Greer Burns & Crain Ltd.
- Priority: JPJP2020-011151 20200127
- Main IPC: H04L25/08
- IPC: H04L25/08 ; H04L5/14 ; H04L12/26 ; H04W24/06 ; H04B17/00 ; H03M1/12 ; H04L25/02

Abstract:
A first shift unit (14) that shifts an amplitude value of the I baseband signal and an amplitude value of the Q baseband signal in a lower direction by the predetermined number of bits so that the predetermined number of lower bits thereof have a value after a decimal point, a first rounding unit (15) that rounds-to-even the amplitude value of the I baseband signal and the amplitude value of the Q baseband signal shifted by the first shift unit (14) with a rounding width of 1 in decimal notation, and a first averaging unit (16) that respectively calculates a time average of the amplitude value of the I baseband signal and the amplitude value of the Q baseband signal rounded by the first rounding unit (15) are included.
Public/Granted literature
- US20210234619A1 MOBILE TERMINAL TEST DEVICE AND MOBILE TERMINAL TEST METHOD Public/Granted day:2021-07-29
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