Invention Grant
- Patent Title: Aircraft inspection support device and aircraft inspection support method
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Application No.: US17285820Application Date: 2019-10-17
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Publication No.: US11336866B2Publication Date: 2022-05-17
- Inventor: Hiroshi Horikawa , Hiroshi Yagi , Takashi Tanaka , Koji Morita , Hirotaka Sato , Masuto Kitamura
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- International Application: PCT/JP2019/040948 WO 20191017
- International Announcement: WO2020/080480 WO 20200423
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G01M17/00

Abstract:
This aircraft inspection support device includes a first imaging unit configured to capture a measurement information image displayed on a measurement instrument-side display unit of a specific measurement instrument associated with a model of an aircraft or an inspection target of an aircraft component, the measurement instrument-side display unit being configured to display measurement information on the inspection target, and an operator-side display unit configured to display the measurement information image so as to be visible to an inspection operator who is performing an inspection operation near the inspection target.
Public/Granted literature
- US20210385416A1 AIRCRAFT INSPECTION SUPPORT DEVICE AND AIRCRAFT INSPECTION SUPPORT METHOD Public/Granted day:2021-12-09
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