Invention Grant
- Patent Title: Scanning range setting method and survey system for the method
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Application No.: US16123676Application Date: 2018-09-06
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Publication No.: US11340068B2Publication Date: 2022-05-24
- Inventor: Tetsutaro Koji
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Roberts Calderon Safran & Cole P.C.
- Priority: JPJP2017-191218 20170929
- Main IPC: G01C15/00
- IPC: G01C15/00 ; G01S7/51 ; G01C11/02 ; G01S7/481 ; G01S17/42 ; G01S17/86

Abstract:
Provided is a scanning range setting method using a surveying instrument configured to measure a distance to a measurement point by using a distance measuring light and measure an angle to the measurement point, and a scanner configured to scan with a scanning light around a rotation axis to acquire three-dimensional point group data. The method includes steps of: (A) measuring a distance to one or more measurement points by the surveying instrument, (B) storing coordinates and angles of the measurement points, (C) automatically setting an area including all of the measurement points as a scanning range by the scanner, and (D) scanning the scanning range by the scanner, wherein a coordinate system of the scanner and a coordinate system of the surveying instrument match each other.
Public/Granted literature
- US20190101389A1 SCANNING RANGE SETTING METHOD AND SURVEY SYSTEM FOR THE METHOD Public/Granted day:2019-04-04
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