An apparatus for automated inspection or maintenance is provided. The apparatus includes a dual slider mechanism for deploying a probe. The dual slider mechanism comprises: a frame; a probe slider configured to attach the probe; a probe linear guide coupled to the frame and configured to guide the probe slider and attached probe in a linear direction; a spring having one end attached to the probe slider; a spring slider attached to another end of the spring; and a spring linear guide coupled to the frame and configured to guide the spring slider and attached spring in the linear direction, in order to guide the probe slider and attached probe in the linear direction along the probe linear guide using the guided spring.