A system for analyzing a state of a thermoset material is disclosed. In various embodiments, the system includes a source of electromagnetic energy configured to expose a sample of the thermoset material to an electric field; a detector configured to determine at least one of a dielectric permittivity or a complex admittance of the sample over a range of frequencies in response to a frequency sweep over the electric field; and an analyzer configured to assess the state of the thermoset material by comparing the at least one of the dielectric permittivity or the complex admittance of the sample against an acceptability map. In various embodiments, the acceptability map comprises a series of acceptability bands that represent a decrease in effective relaxation time from a baseline fresh batch of the thermoset material.