Invention Grant
- Patent Title: Method of measuring electromagnetic signal and electronic device therefor
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Application No.: US16738864Application Date: 2020-01-09
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Publication No.: US11340281B2Publication Date: 2022-05-24
- Inventor: Youngbae Lee , Yongseob Yun , Seungwoo Lee , Jinchul Choi , Yongsang Yun
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2019-0002687 20190109
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R29/08 ; G01R29/26

Abstract:
An electronic device and method related to measurement of an electromagnetic (EM) signal emitted from an external electronic device. The electronic device including a processor, a memory, and an EM sensor. The memory stores instructions, which, when executed, enable the processor to: obtain an input signal including an electromagnetic signal of an external electronic device and a self-noise using the EM sensor; identify an ambient condition of the electronic device; identify a compensation self-noise corresponding to the ambient condition; generate a signal pattern, based on the input signal and the compensation self-noise; and identify the external electronic device, based on at least a part of the signal pattern.
Public/Granted literature
- US20200217882A1 METHOD OF MEASURING ELECTROMAGNATIC SIGNAL AND ELECTRONIC DEVICE THEREFOR Public/Granted day:2020-07-09
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