- Patent Title: Test method and manufacturing method for electrical storage device
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Application No.: US17033021Application Date: 2020-09-25
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Publication No.: US11340302B2Publication Date: 2022-05-24
- Inventor: Yoshio Matsuyama , Ruri Tanaka , Kiwamu Kobayashi
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Applicant Address: JP Toyota
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota
- Agency: Oliff PLC
- Priority: JPJP2019-219699 20191204
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/385 ; G01R31/367 ; H01M4/04 ; H01M10/48 ; G01R31/374

Abstract:
By a first energization process of applying a voltage with the power supply to cause a current for charging the electrical storage device to flow through the circuit and a second energization process of, when a transition condition is satisfied during the first energization process, decreasing the voltage of the power supply to cause the current to further flow, a condition of an electrical storage is determined. An effective resistance value of the circuit is set to 0.1Ω or below. A decrease in the voltage of the power supply in transition from the first energization process to the second energization process is set such that the effective resistance value in the second energization process is an intermediate value between a parasitic resistance value of the circuit and the effective resistance value in the first energization process.
Public/Granted literature
- US20210173013A1 TEST METHOD AND MANUFACTURING METHOD FOR ELECTRICAL STORAGE DEVICE Public/Granted day:2021-06-10
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