Invention Grant
- Patent Title: Lifetime estimation device, lifetime estimation method, and abnormality detection method of secondary battery
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Application No.: US16761289Application Date: 2018-11-07
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Publication No.: US11340306B2Publication Date: 2022-05-24
- Inventor: Toshiyuki Isa , Akihiro Chida , Ryota Tajima
- Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Applicant Address: JP Atsugi
- Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Current Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Current Assignee Address: JP Atsugi
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JPJP2017-221035 20171116
- International Application: PCT/IB2018/058726 WO 20181107
- International Announcement: WO2019/097357 WO 20190523
- Main IPC: G01R31/392
- IPC: G01R31/392 ; G01R31/36 ; G01R31/367 ; G01R31/374

Abstract:
An object is to predict a deterioration state of a secondary battery even in an environment where temperature and a charging voltage change. A lifetime estimation device of the secondary battery includes a measuring unit for measuring the capacity of the secondary battery in the full charging state; a temperature sensing unit for sensing the ambient temperature of the secondary battery; and a storage unit for storing a table of a proportional coefficient corresponding to temperature in advance, and a predicted deterioration line of the secondary battery is calculated with the use of a nonlinear regression equation approximated to a measured deterioration line obtained by the measuring unit. The lifetime estimation device may construct a lifetime estimation system with the use of a neural network.
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