Invention Grant
- Patent Title: Predictive analytics for failure detection
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Application No.: US15403820Application Date: 2017-01-11
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Publication No.: US11340977B2Publication Date: 2022-05-24
- Inventor: Emrah Acar , Gradus Janssen , Rajiv V. Joshi , Tong Li
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Daniel Morris
- Main IPC: G06N20/00
- IPC: G06N20/00 ; G06F11/07 ; G05B19/418

Abstract:
A computer-implemented method and computing system are provided for failure prediction of a batch of manufactured objects. The method includes classifying, by a processor sing a simulation, a set of samples with uniformly distributed parameter values, to generate sample classifications for the batch of manufactured objects. The method further includes determining, by the processor, a centroid of failing ones of the samples in the set, based on the sample classifications. The method also includes generating, by the processor, a new set of samples with a distribution around the centroid of the failing ones of the sample in the set. The method additionally includes populating, by the processor, a nearest neighbor vector space using the new set of samples. The method further includes classifying, by the processor, the new set of samples by performing a nearest neighbor search on the nearest neighbor vector space using a distance metric.
Public/Granted literature
- US20180197091A1 PREDICTIVE ANALYTICS FOR FAILURE DETECTION Public/Granted day:2018-07-12
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